Microstructural Characterization of Materials
| Author | : | |
| Rating | : | 4.45 (863 Votes) |
| Asin | : | 0470027851 |
| Format Type | : | paperback |
| Number of Pages | : | 550 Pages |
| Publish Date | : | 2013-06-18 |
| Language | : | English |
DESCRIPTION:
The most commonly used probes are visible light, X-ray radiation, a high-energy electron beam, or a sharp, flexible needle. The principal methods of characterization, including diffraction analysis, optical microscopy, electron microscopy, and chemical microanalytical techniques are treated both qualitatively and quantitatively. An additional chapter has been added to the new edition to cover surface probe microscopy, and there are new sections on digital image recording and analysis, orientation imaging microscopy, focused ion-beam instruments, atom-probe micros
Microstructural characterization is usually achieved by allowing some form of probe to interact with a carefully prepared specimen. An additional chapter has been added to the new edition to cover surface probe microscopy, and there are new sections on digital image recording and analysis, orientation imaging microscopy, focused ion-beam instruments, atom-probe microscopy, and 3-D image reconstruction. As well as being fully updated, this second edition also includes revised and expanded examples and exercises, with a solutio
"Five Stars" according to Michael Opoku. Good. RiverSide said Practical-minded, but. I am revising my first review, which was based on a quick read of the first few chapters. Unfortunately, Amazon forbids revising the stars given to the book. There's no way this book earns the three stars I originally gave it.The equations are *regularly* wrong, to the point we can't trust what the author says anymore - it could be . "Good Purchase" according to John Rosenow. The book met all of my expectations. No damage anywhere on the book, and it arrived on time.